GrainGenes Trait Study Report: Grain yield, Narasimhamoorthy06

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Trait Study	Grain yield, Narasimhamoorthy06
Trait	Yield
Reference	Narasimhamoorthy B et al. (2006) Advanced backcross QTL analysis of a hard winter wheat x synthetic wheat population. Theoretical and Applied Genetics 112:787-796.
Description	Grain yield (YLD) was recorded at Hutchinson and Manhattan, Kansas.
Protocol	Grain yield (YLD) was measured from each plot and expressed as kg/ha.
Map Data	Wheat, TA4152-4 x Karl92
Population Size	190
Population Type	BC2F2:4 lines
QTL Analysis Method	Single-marker regression. Positions of detected QTLs were determined approximately using simple interval mapping based on a BC2S1 model.
Markers Tested	151
Image	Yield QTLs on 2D in TA 4152-4 x Karl 92 Yield QTLs on 7D in TA 4152-4 x Karl 92
QTL	QYld.ksu-2D QYld.ksu-7D
Trait Score	YLD, Hutchinson 2003 YLD, Manhattan 2003
Data Source	Narasimhamoorthy, Brindha