GrainGenes Map Data Report: Wheat_Yr79

Feng J et al. (2018) Characterization of Novel Gene Yr79 and Four Additional Quantitative Trait Loci for All-Stage and High-Temperature Adult-Plant Resistance to Stripe Rust in Spring Wheat PI 182103 Phytopathology 108:737-747.

Remarks

Synonyms were added to the maps for improved CMap correspondences.

(Curator Note, VCB 10.2020) QTL QyrPI182103.wgp-4DL is illultrated on Figure 2 in the paper as QyrPI183103.wgp-4DS, but is referred to as 4DL in the abstract and within the body of the paper

Data Curator

Blake, Victoria Carollo

QTL

Locus

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