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GrainGenes Trait Study Report: Flour yield, Nelson06

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Trait Study
Flour yield, Nelson06
Trait
Kernel texture
Description
Flour yield was measured at USDA Soft Wheat Regional Quality Laboratory in Wooster, OH (USA,) and INRA (Clermont-Ferrand, France).
Protocol
Flour yield was determined as the proportion by weight of straight-grade flour recovered from a milled grain sample, adjusted to correspond to a sample ground at 14% moisture. SE-adjusted yield has been corrected for softness equivalent.
Environment
Clermont-Ferrand 1994
Clermont-Ferrand 1997
Tulelake 1995
Tulelake 1999
Map Data
Wheat, Synthetic x Opata
Population Size
114
Population Type
F7 single-seed-descent lines
QTL Analysis Method
Composite interval mapping with QTL Cartographer 2.50, using forward regression selection of 5 cofactors and an acceptance threshold of LOD 3.8.
Markers Tested
554
Image
Composite interval map of wheat chromosome 5D for wheat quality traits in the ITMI population
Trait Score
Flour yield, Clermont-Ferrand 1994
Flour yield, Tulelake 1995
Flour yield, Tulelake 1999
SE-adjusted flour yield, Tulelake 1995
Data Source
Nelson, James C.