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GrainGenes Trait Study Report: Grain yield, Narasimhamoorthy06

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Trait Study
Grain yield, Narasimhamoorthy06
Trait
Yield
Reference
ReferenceNarasimhamoorthy B et al. (2006) Advanced backcross QTL analysis of a hard winter wheat x synthetic wheat population. Theoretical and Applied Genetics 112:787-796.
Description
Grain yield (YLD) was recorded at Hutchinson and Manhattan, Kansas.
Protocol
Grain yield (YLD) was measured from each plot and expressed as kg/ha.
Map Data
Wheat, TA4152-4 x Karl92
Population Size
190
Population Type
BC2F2:4 lines
QTL Analysis Method
Single-marker regression. Positions of detected QTLs were determined approximately using simple interval mapping based on a BC2S1 model.
Markers Tested
151
Image
Yield QTLs on 2D in TA 4152-4 x Karl 92
Yield QTLs on 7D in TA 4152-4 x Karl 92
QTL
QYld.ksu-2D
QYld.ksu-7D
Trait Score
YLD, Hutchinson 2003
YLD, Manhattan 2003
Data Source
Narasimhamoorthy, Brindha

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