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GrainGenes Trait Study Report: Harvest index, Narasimhamoorthy06

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Trait Study
Harvest index, Narasimhamoorthy06
Harvest index
ReferenceNarasimhamoorthy B et al. (2006) Advanced backcross QTL analysis of a hard winter wheat x synthetic wheat population. Theoretical and Applied Genetics 112:787-796.
Harvest index (HAI) was recorded at Hutchinson and Manhattan, Kansas.
Grain yield (YLD) was measured from each plot and harvest index (HAI) was computed as YLD/BM
Harvest index (HAI) was computed as YLD/BM.
Map Data
Wheat, TA4152-4 x Karl92
Population Size
Population Type
BC2F2:4 lines
QTL Analysis Method
Single-marker regression. Positions of detected QTLs were determined approximately using simple interval mapping based on a BC2S1 model.
Markers Tested
Trait Score
HAI, Hutchinson 2003
HAI, Manhattan 2003
Data Source
Narasimhamoorthy, Brindha

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